VLC Photonics provides fully automated and semi-automated PIC testing services for wafer-level, die-level, and packaged photonic chips, with electrical characterization up to 110 GHz and optical coverage from visible to mid-IR.
Whether you need a fast characterization campaign or a complete reliability test protocol, our team will scope your project and deliver within your timeline.
>100GHz
NRZ/PAM4
350nm to 4000nm
>1000 dies/m
Testing offerings
Three levels of PIC characterization
01
Wafer Level Testing
Involves the fully automated alignment of probes with nanometer precision, characterizing optical, electrical DC, and RF parameters.
02
Die Level Testing
Testing for of diced or cleaved dies. Semi-automated setups allow for much greater flexibility in the characterization setup and the kind of experiments and measurements possible, while fully automated setups can accurately measure 100’s-1000’s of individual dies with great speed and repeatability.
03
Packaged PIC Testing
Chip-on-board (CoB) or Chip-on-carrier (CoC) assemblies allow for an easier measurement due to predefined connectorized inputs and outputs via electrical pins and optical fiber pigtails. Full characterization and testing services are also provided for packaged dies.
Capabilities
What we measure
Infrastructure
Clean room
Testing conducted in clean room laboratories by experienced engineers using state-of-the-art equipment. It is certified as ISO Class 7 (Class 10.000) with full ESD protection.
Optical
Optical Testing
Complete optical testing with various light sources (lasers, supercontinuum, LEDs) spanning visible to near-infrared and mid-infrared wavelengths.
Electrical
Electrical Testing
DC and RF testing up to 110 GHz frequency, signal processing, and multi-probe testing stations.
Reliability
Reliability Testing Services
Evaluate infant mortality with aging tests, including, temperature/current/voltage cycling, and burn-in testing. More advanced reliability tests for vibration, shock, radiation, etc. also available on demand.
High-speed
High-Speed Signal Generation and Real-Time Analysis
Waveform signal generation combined with a real-time oscilloscope featuring 100 GHz bandwidth and 256 GSa/s sampling rate on two independent channels, enabling precise evaluation of eye diagrams and Bit Error Rate for high-speed signal integrity assessment.
Services offerings
Full-spectrum testing services
Visual Inspection
Detailed visual inspection of packages, dies or bars, and wafers for any defects, including Scanning Electron Microscope (SEM) for in-depth analysis.
Design for Testing
Expert advice on layout arrangement for optimal probing and measurement, best fiducials and alignment markers, and test structures, ensuring efficient testing processes.
Test Design Kits
implemented as .pdf guidelines (request here), and as software implementations for the main photonic layout tools Luceda IPKISS and Synopsys Optocompiler
- Optimized Design for Testing → Ensures input and output ports (optical and electrical), fiducials and alignment markers, and test structures are properly positioned for seamless integration with standard automated testing procedures.
- Streamlined Testing Process → Encourages designers to consider testing from the start, reducing late-stage design modifications.
- Cost Reduction → Helps test houses minimize engineering expenses related to measurement setups.
- Faster Test Campaigns → Speeds up testing procedures, improving efficiency and lowering overall costs.
Optical probing
Vertical coupling and edge-coupling are both possible at die and wafer level, using different types of optical probes for wavelengths, from visible to O/C/L bands and mid-IR.
Electrical probing
Electrical single and multi-contact probes for DC and RF up to 110 GHz.
In-Depth Analysis
Comprehensive analysis of measurement traces, failure modes analysis, root cause analysis, and test reports for compliance with specifications.
Reliability testing
Temperature cycling and burn-in, voltage and current stressing for accelerated lifetime testing.
High-Speed Signal: Eye Diagrams & BER Testing
Supporting PAM and NRZ modulation formats for data communication rates up to 112 Gbaud, with eye diagram analysis and Bit Error Rate (BER) measurements to validate signal quality and compliance.
Environmental testing
If more extensive testing like e.g. environmental, radiation, mechanical (half sine, full wave vibration and shock tests) are required, we have partners who can support too.
Start a conversation with one of our experts
Application Engineer
